Update README.md

README.md

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----
-license: mit
----
+---
+language:
+- en
+license: mit
+pretty_name: EUV Illumination Pupil Coherence Drift Detection v0.1
+dataset_name: euv-illumination-pupil-coherence-drift-detection-v0.1
+tags:
+- clarusc64
+- euv
+- lithography
+- optics
+- drift-detection
+task_categories:
+- tabular-classification
+- tabular-regression
+size_categories:
+- 1K<n<10K
+configs:
+- config_name: default
+  data_files:
+  - split: train
+    path: data/train.csv
+  - split: test
+    path: data/test.csv
+---
+
+## Purpose
+
+Detect when illumination-pupil coupling begins to drift toward loss of critical dimension control.
+
+This dataset maps coherence decay between:
+
+pupil geometry  
+dose distribution  
+printed wafer metrics  
+
+The goal is to identify drift before feature collapse.
+
+## Task
+
+Input system metrics.
+
+Predict:
+
+drift_score  
+drift_flag  
+
+Format:
+float,int
+
+Example:
+0.42,1
+
+## Why this matters
+
+Lithography systems rarely fail instantly.  
+They drift.
+
+Early detection prevents yield loss and tool downtime.
+
+## Evaluation
+
+Absolute error on drift_score  
+Classification bonus for drift_flag  
+
+Format validity scored when ground truth absent.
+
+## Version
+
+v0.1